Atomic Force Microscope (AFM)

Last changed: 08 September 2020

High-resolution probing of the surface morphology, structure and properties, using interaction of a mechanical nanosized tip with the studied material.


The instrument uses sensitive tip that enables mapping´of both geography and physical and chemical properties of very small surfaces with the resolution of single nanometers.

Typical objects for such studies are processes in cell membranes, functional studies of individual protein molecules and high resolution mapping of the surfaces in 3 dimensions for plant and animal tissues and for various functional materials.



Vadim Kessler

Henrik Hansson

Gulaim Seisenbaeva

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